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Probing C₈₄-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

11.5K Views

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13:58 min

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September 28th, 2016

DOI :

10.3791/54235-v

September 28th, 2016

•

11,533 Views

Mon-Shu Ho¹, Chih-Pong Huang², Jyun-Hwei Tsai³, Che-Fu Chou¹, Wen-Jay Lee³

¹Department of Physics and Institute of Nanoscience, National Chung Hsing University, ²Metallurgy Section, Materials & Electro-Optics Research Division, National Chung-Shan Institute of Science and Technology, ³National Center for High-Performance Computing

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副本

摘要

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C84 embedded Si Substrate

Scanning Probe Microscopy

Molecular Dynamics

Silicon 111 Substrate

Electronic Properties

Optoelectronic Properties

Mechanical Properties

Magnetic Properties

Field Emission Properties

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