JoVE Logo

Iniciar sesión

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

6.9K Views

06:24 min

September 13th, 2020

DOI :

10.3791/61758-v

September 13th, 2020

6,931 Views

1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

Transcribir

Explorar más videos

Keywords Nanoparticles
JoVE Logo

Privacidad

Condiciones de uso

Políticas

Investigación

Educación

ACERCA DE JoVE

Copyright © 2024 MyJoVE Corporation. Todos los derechos reservados