JoVE Logo

Sign In

Thin Film Technology

1 ARTICLES PUBLISHED IN JoVE

image

Engineering

In Situ Monitoring of the Accelerated Performance Degradation of Solar Cells and Modules: A Case Study for Cu(In,Ga)Se2 Solar Cells
Mirjam Theelen 1, Klaas Bakker 1, Henk Steijvers 1, Stefan Roest 2, Peter Hielkema 3, Nicolas Barreau 4, Erik Haverkamp 5,6
1TNO Solliance, Thin Film Technology, 2Eternal Sun, 3Hielkema Testequipment, 4Institut des Matériaux Jean Rouxel (IMN)-UMR 6502, Université de Nantes, CNRS, 5ReRa Solutions BV, 6Institute of Molecules and Materials, Radboud University

Two 'Combined Stress test with in situ measurement' setups, which allow real-time monitoring of accelerated degradation of solar cells and modules, were designed and constructed. These setups allow the simultaneous use of humidity, temperature, electrical biases, and illumination as independently controlled stress factors. The setups and various experiments executed are presented.

JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved