Results: Topography and Current Imaging of ONBs and Cu2O NPs by AFM-SECM
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Conclusion
Trascrizione
This protocol employees a powerful and innovative technology so called Atomic Force Microscope coupled with Electro-chemicals Scanning Microscope which is AFM-SECM to scan the morphological and the electrochemical information on faceted nanomateri
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Atomic force microscopy (AFM) combined with scanning electrochemical microscopy (SECM), namely, AFM-SECM, can be used to simultaneously acquire high-resolution topographical and electrochemical information on material surfaces at nanoscale. Such information is critical to understanding heterogeneous properties (e.g., reactivity, defects, and reaction sites) on local surfaces of nanomaterials, electrodes and biomaterials.