Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay MethodTakato Asada 1, Yoshihito Ichikawa 1, Masashi Kato 1,2
1Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology, 2Frontier Research Institute for Material Science, Nagoya Institute of Technology
As one of the important physical parameters in semiconductors, carrier lifetime is measured herein via a protocol employing the microwave photoconductivity decay method.
