In-situ-SIMS und IR-Spektroskopie von gut definierten Oberflächen durch weiche Landung der Messe-Ionen ausgewählt Vorbereitet

2:13

Mounting of COOH-SAM Surfaces on Gold for Soft Landing of Mass-selected Ions

3:07

Soft Landing of Mass-selected Ru(bpy)₃²⁺ onto COOH-SAM Surfaces

4:17

Analysis by In Situ TOF-SIMS Before and After Exposure to Reactive Gases

5:59

Analysis by In Situ FT-ICR-SIMS and IRRAS During and After Soft Landing

7:28

Results: Characterization of Organometallic Ions Soft Landed onto COOH-SAMs by In Situ SIMS and IR Spectroscopy

9:39

Conclusion