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DOI :
10.3791/53452-v
March 29th, 2016
Chapters
0:05
Title
1:29
Single Crystal Surface Preparation for Nuclear Reaction Analysis (NRA) in Ultra-high Vacuum
8:07
Surface Hydrogen Nuclear Reaction Analysis Measurements
9:24
Bulk and Interface Hydrogen Nuclear Reaction Analysis: Preparation and Measurement
11:02
Results: Nuclear Reaction Analysis Hydrogen Depth Profiles for Single Crystal Palladium and from Silicon Dioxide Films on Silicon
12:50
Conclusion
我々は、定量的に表面上に、体積で、 固体材料の界面層の水素原子の密度を評価するために、12 Cの共鳴核反応分析(NRA)(αγ、15 N)1 Hの適用を示します。パラジウムの表面近傍水素深さプロファイリング(110)単結晶およびSiO 2 / Siから(100)スタックに記載されています。
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