JoVE Journal
Engineering
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08:46 min
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April 13th, 2016
DOI :
April 13th, 2016
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Title
1:28
Steps for Performing Tomography Scans at Beamline 8.3.2 (ALS, LBNL)
4:02
Setting up the Scan Parameters Using the Data Acquisition Computer
4:54
Results: Multi-scale Features Imaged in an Entire Micro-electronic Package Using Synchrotron Radiation Microtomography
6:11
Conclusion
Transcript
This experiment was designed to utilize synchrotron radiation microtomography, which is a non-destructive three-dimensional imaging technique, in order to investigate a complex multi-level sample. The sample being imaged here is an entire microele
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For this study synchrotron radiation micro-tomography, a non-destructive three-dimensional imaging technique, is employed to investigate an entire microelectronic package with a cross-sectional area of 16 x 16 mm. Due to the synchrotron's high flux and brightness the sample was imaged in just 3 min with an 8.7 µm spatial resolution.
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