Research
Education
Sign In
EN
EN - English
CN - 中文
DE - Deutsch
ES - Español
KR - 한국어
IT - Italiano
FR - Français
PT - Português
Please note that all translations are automatically generated. Click here for the English version.
DOI :
10.3791/61955-v
July 14th, 2022
Chapters
0:04
Introduction
0:29
Scanning Electron Microscope (SEM) and Cryogenic Station Preparation
1:31
Sample Vitrification
2:51
Sample Surface Imaging and Feature Location
4:19
Cross-Section Preparation
6:52
Energy Dispersive X-Ray (EDX) Mapping
8:12
Results: Representative Nanoscale Liquid-Solid Interface Characterization
10:24
Conclusion
低温聚焦离子束(FIB)和扫描电子显微镜(SEM)技术可以为完整固液界面的化学和形态提供关键见解。详细介绍了制备此类界面的高质量能量色散X射线(EDX)光谱图的方法,重点是储能器件。
Tags
-- Views
Related Videos
Privacy
Terms of Use
Policies
Contact Us
Recommend to library
JoVE NEWSLETTERS
JoVE Journal
Methods Collections
JoVE Encyclopedia of Experiments
Archive
JoVE Core
JoVE Business
JoVE Science Education
JoVE Lab Manual
Faculty Resource Center
Authors
Overview
Publishing Process
Editorial Board
Scope and Policies
Peer Review
FAQ
Submit
Librarians
Testimonials
Subscriptions
Access
Resources
Library Advisory Board
ABOUT JoVE
Leadership
Copyright © 2024 MyJoVE Corporation. All rights reserved