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05:34 min
June 30th, 2023
DOI :
10.3791/64823-v
Chapters
0:04
Introduction
0:31
Bacterial Sample Preparation and AFM Measurements
3:10
Results: Atomic Force Contact Microscopic Analysis of Bacterial Cultures Under Nanoparticle Influence
4:46
Conclusion
Transcript
该协议显示了使用接触模式原子力显微镜来观察由于特定疾病或治疗引起的细胞形态变化。强烈建议在此过程中使用密封容器以避免污染,并尽快分析固定样品以避免老化。首先将样品固定在载玻片上,将载玻片轻轻地放在火焰上几次,直到样品干燥。
将固定的样品放入培养皿中,并将它们运送到原子力显微镜设备中进行观察。接下来,打开计算机和原子力显微镜。然后在软件中选择接触模式、ContAI-G 探头和自动斜率选项。
通过将设定点设置为 20 纳米、P 增益设置为 10, 000、I 增益设置为
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Summary
在这里,我们介绍了原子力显微镜(AFM)作为一种简单快速的细菌表征方法的应用,并分析了诸如细菌大小和形状,细菌培养生物膜以及纳米颗粒作为杀菌剂的活性等细节。
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