Yoshihito Ichikawa

Department of Electrical & Mechanical Engineering

Nagoya Institute of Technology

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INSTITUTIONS

Nagoya Institute of Technology

JOVE ARTICLES

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Takato Asada¹,

Yoshihito Ichikawa¹,

Masashi Kato^1,2

¹Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology,

²Frontier Research Institute for Material Science, Nagoya Institute of Technology

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