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Engineering

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Mon-Shu Ho 1, Chih-Pong Huang 2, Jyun-Hwei Tsai 3, Che-Fu Chou 1, Wen-Jay Lee 3
1Department of Physics and Institute of Nanoscience, National Chung Hsing University, 2Metallurgy Section, Materials & Electro-Optics Research Division, National Chung-Shan Institute of Science and Technology, 3National Center for High-Performance Computing

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

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