Sample Preparation, Installation, and Sample Approach
3:27
Topography Imaging
4:33
MFM Imaging
6:23
Results: MFM Imaging of Magnetic Twin Boundaries in a Single Crystal Ni-Mn-Ga Sample
6:58
Conclusion
Transkript
Magnetic Force Microscopy, or MFM, employs a vertically-magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. By balancing decreasing lift height against increasing drive
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Magnetic force microscopy (MFM) employs a vertically magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. Optimizing MFM spatial resolution and sensitivity requires balancing decreasing lift height against increasing drive (oscillation) amplitude, and benefits from operating in an inert atmosphere glovebox.