Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron MicroscopyChristopher J. Guérin 1,2,3, Anna Kremer 1,2,3, Peter Borghgraef 1,2,3, Saskia Lippens 1,2,3
1VIB Bio Imaging Core, 2VIB Inflammation Research Center, 3Department of Molecular Biomedical Research, UGent
Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.