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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

DOI :

10.3791/59480-v

9:09 min

August 10th, 2019

August 10th, 2019

8,794 Views

1VIB Bio Imaging Core, 2VIB Inflammation Research Center, 3Department of Molecular Biomedical Research, UGent

Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.

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Serial Block Face

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