JoVE Logo
Sportello unico per docenti

Accedi

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

6.8K Views

06:24 min

September 13th, 2020

DOI :

10.3791/61758-v

September 13th, 2020

6,777 Views

1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

Trascrizione

Esplora Altri Video

Nanoparticles
JoVE Logo

Riservatezza

Condizioni di utilizzo

Politiche

Ricerca

Didattica

CHI SIAMO

Copyright © 2024 MyJoVE Corporation. Tutti i diritti riservati