Deepak Goyal

Holly D. Carlton¹, 

John W. Elmer¹, 

Yan Li², 

Mario Pacheco², 

Deepak Goyal², 

Dilworth Y. Parkinson³, 

Alastair A. MacDowell³ 

¹Materials Engineering Division, Lawrence Livermore National Laboratory, 

²Assembly Test and Technology Development Failure Analysis Labs, Intel Corporation, 

³Advanced Light Source, Lawrence Berkeley National Laboratory