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10:39 min
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October 11th, 2016
DOI :
October 11th, 2016
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing
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Reservoir Condition Pore-scale Imaging of Multiple Fluid Phases Using X-ray Microtomography
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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
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Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
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Protocol of Electrochemical Test and Characterization of Aprotic Li-O2 Battery
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Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography
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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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