National Institute of Standards and Technology

1 ARTICLES PUBLISHED IN JoVE

Engineering

Analysis of Contact Interfaces for Single GaN Nanowire Devices

Andrew M. Herrero¹, Paul T. Blanchard¹, Kris A. Bertness¹

¹Quantum Electronics and Photonics Division, National Institute of Standards and Technology

A technique was developed that removes Ni/Au contact metal films from their substrate to allow for the examination and characterization of the contact/substrate and contact/NW interfaces of single GaN nanowire devices.