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Here, we present a protocol for niobium oxide films deposition by reactive sputtering with different oxygen flow rates for use as an electron transport layer in perovskite solar cells.
Reactive sputtering is a versatile technique used to form compact films with excellent homogeneity. In addition, it allows easy control over deposition parameters such as gas flow rate that results in changes on composition and thus in the film required properties. In this report, reactive sputtering is used to deposit niobium oxide films. A niobium target is used as metal source and different oxygen flow rates to deposit niobium oxide films. The oxygen flow rate was changed from 3 to 10 sccm. The films deposited under low oxygen flow rates show higher electrical conductivity and provide better perovskite solar cells when used as electron transport layer.
The sputtering technique is widely used to deposit high-quality films. Its main application is in the semiconductor industry, although it is also used in surface coating for improvement in mechanical properties, and reflective layers1. The main advantage of sputtering is the possibility to deposit different materials over different substrates; the good reproducibility and control over the deposition parameters. The sputtering technique allows deposition of homogeneous films, with good adhesion over large areas and at low-cost when compared with other deposition methods like chemical vapor deposition (CVD), molecular beam epitaxy (MBE) and atomic layer deposition (ALD)1,2. Commonly, semiconductor films deposited by sputtering are amorphous or polycrystalline, however, there are some reports on epitaxial growth by sputtering3,4. Nevertheless, the sputtering process is highly complex and the range of the parameter is wide5, so in order to achieve high-quality films, a good comprehension of the process and parameter optimization is necessary for each material.
There are several articles reporting on the deposition of niobium oxide films by sputtering, as well as niobium nitride6 and niobium carbide7. Among Nb-oxides, niobium pentoxide (Nb2O5) is a transparent, air-stable and water-insoluble material that exhibits extensive polymorphism. It is an n-type semiconductor with band gap values ranging from 3.1 to 5.3 eV, giving these oxides a wide range of applications8,9,10,11,12,13,14,15,16,17,18,19. Nb2O5 has attracted considerable attention as a promising material to be used in perovskite solar cells due to its comparable electron injection efficiency and better chemical stability compared to titanium dioxide (TiO2). In addition, the band gap of Nb2O5 could improve the open-circuit voltage (Voc) of the cells14.
In this work, Nb2O5 was deposited by reactive sputtering under different oxygen flow rates. At low oxygen flow rates, the conductivity of the films were increased without making use of doping, which introduces impurities on the system. These films were used as electron transport layer in perovskite solar cells improving the performance of these cells. It was found that decreasing the amount of oxygen induces the formation of oxygen vacancies, which increases the conductivity of the films leading to solar cells with better efficiency.
1. Etching and cleaning the substrate
2. Deposition of niobium oxide films
3. Constructing the solar cells
In the sputtering system, the deposition rate is strongly influenced by the oxygen flow rate. The deposition rate decreases when the oxygen flow is increased. Considering the present conditions of the target area used and plasma power, it is observed that from 3 to 4 sccm there is an expressive decrease on the deposition rate, however, when the oxygen is increased from 4 to 10 sccm it becomes less pronounced. In the regime of 3 sccm the deposition rate is 1.1 nm/s, decreasing abruptly to 0.1 nm/s for 10 sccm as seen in <...
The niobium oxide films prepared in this work was used as electron transport layer in perovskite solar cells. The most important characteristic required for an electron transport layer is to prevent recombination, blocking holes and transferring efficiently electrons.
In this respect the use of reactive sputtering technique is advantageous since it produces dense and compact films. Also, as already mentioned, compared to sol-gel, anodization, hydrothermal, and chemical vapor deposition synthes...
The authors have nothing to disclose.
The work was supported by Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP), Centro de Desenvolvimento de Materiais Cerâmicos (CDMF- FAPESP Nº 2013/07296-2, 2017/11072-3, 2013/09963-6 and 2017/18916-2). Special thanks to Professor Máximo Siu Li for PL measurements.
Name | Company | Catalog Number | Comments |
2-propanol | Merck | 67-63-0 | solvent with maximum of 0.005% H2O |
4-tert-butylpyridine | Sigma Aldrich | 3978-81-2 | chemical with 96% purity |
acetonitrile | Sigma Aldrich | 75-05-8 | anhydrous solvent , 99.8% purity |
bis(trifluoromethane)sulfonimide lithium salt | Sigma Aldrich | 90076-65-6 | chemical with ≥99.95% purity |
chlorobenzene | Sigma Aldrich | 108-90-7 | anhydrous solvent , 99.8% purity |
ethanol | Sigma Aldrich | 200-578-6 | solvent |
Fluorine doped tin oxide (SnO2:F) glass substrate | Solaronix | TCO22-7/LI | substrate to deposit films |
Kaptom tape | Usinainfo | 04227 | thermal tape used to cover the substrates |
Kurt J Lesker magnetron sputtering system | Kurt J Lesker | ------ | Sputtering equipment used to deposit compact films |
Lead (II) iodide | Alfa Aesar | 10101-63-0 | PbI2 salt- 99.998% purity |
methylammonium iodide | Dyesol | 14965-49-2 | CH3NH3I salt |
N2,N2,N2′,N2′,N7,N7,N7′,N7′-octakis (4-methoxyphenyl)-9,9′-spirobi [9H-fluorene]-2,2′,7,7′-tetramine | Sigma Aldrich | 207739-72-8 | Spiro-OMeTAD salt, 99% purity |
Niobium target of 3” | CBMM- Brazilian Metallurgy and Mining Company | ------ | niobium sputtering target used in the sputtering system |
N-N dimethylformamide | Merck | 68-12-2 | solvent with maximum of 0.003% H2O |
TiO2 paste | Dyesol | DSL 30NR-D | titanium dioxide paste |
tris(2-(1H-pyrazol-1-yl)-4-tert-butylpyridine)cobalt(III) tri[bis(trifluoromethane)sulfonimide] | Dyesol | 329768935 | FK 209 Co(III) TFSL salt |
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