Shien Ri

Accurate pixel-to-pixel correspondence adjustment in a digital micromirror device camera by using the phase-shifting moiré method.

Intensity range extension method for three-dimensional shape measurement in phase-measuring profilometry using a digital micromirror device camera.

Theoretical error analysis of the sampling moiré method and phase compensation methodology for single-shot phase analysis.

Accurate full-field optical displacement measurement technique using a digital camera and repeated patterns.

Digital sampling Moiré as a substitute for microscope scanning Moiré for high-sensitivity and full-field deformation measurement at micron/nano scales.