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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel

DOI :

10.3791/2588-v

8:57 min

July 6th, 2011

July 6th, 2011

27,509 Views

1Centre of interdisciplinary electron microscopy, École Polytechnique Fédérale de Lausanne

Dit protocol beschrijft hoe hars ingebed hersenweefsel kan worden voorbereid en afgebeeld in de drie dimensies in de gerichte ion beam, scanning electronen microscoop.

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