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Nanotopology af celleadhæsion ved variabel-Angle total intern refleksion Fluorescence Microscopy (VA-TIRFM)

DOI :

10.3791/4133-v

October 2nd, 2012

October 2nd, 2012

10,017 Views

1Hochschule Aalen, Institut für Angewandte Forschung

Topologi af celleadhæsion på et substrat måles med nanometer præcision ved variabel vinkel total intern refleksion fluorescensmikroskopi (VA-TIRFM).

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Bioengineering

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