Name: fabrication and characterization of photonic crystal slow light waveguides and cavities
Uploaded: 2012-11-30T13:00:00
Description: Watch this Scientific Journal Video about Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities at JoVE.com

저자는 굉장히 RS 기법 및 측정의 실행에 관한 유용한 토론을 파비아 대학에서 박사 마테오 Galli, 박사 시몬 L. Portalupi과 교수 루치 C. Andreani을 인정합니다.

면책 조항 : 다음 프로토콜 광자 크리스탈 waveguides와 충치의 제조 및 특성 기술을 다루는 일반적인 프로세스 흐름을 제공합니다. 프로세스 흐름은 우리의 실험실에서 사용할 수있는 특정 장비에 최적화되어 있습니다, 다른 시약이나 장비를 사용하는 경우 매개 변수가 다를 수 있습니다. 1. 샘플 준비 <ol><li> 샘플 Cleaving은 - 실리콘 - 온 - 절연체 (SOI) 웨이퍼를 타?...

<ol>
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J. 2 (2), 181-194 (2010).</li><li>Ishikura, N., Baba, T., Kuramochi, E., Notomi, M. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Large+tunable+fractional+delay+of+slow+light+pulse+and+its+application+to+fast+optical+correlator.">Large tunable fractional delay of slow light pulse and its application to fast optical correlator.</a> Opt. Express. 19 (24), 24102-24108 (2011).</li><li>Beggs, D. M., Rey, I. H., Kampfrath, T., Rotenberg, N., Kuipers, L., Krauss, T. F. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Ultrafast+tunable+optical+delay+line+based+on+indirect+photonic+transitions.">Ultrafast tunable optical delay line based on indirect photonic transitions.</a> Phys. Rev. Lett. 108 (21), 213901 (2012).</li><li>Beggs, D. M., White, T. P., O'Faolain, L., Krauss, T. 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Express. 17 (4), 2944-2953 (2009).</li><li>Corcoran, B., Monat, C., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=light+emission+in+silicon+through+slow-light+enhanced+third-harmonic+generation+in+photonic-crystal+waveguides.">light emission in silicon through slow-light enhanced third-harmonic generation in photonic-crystal waveguides.</a> Nature Photon. 3, 206-210 (2009).</li><li>Li, J., O'Faolain, L., Rey, I. H., Krauss, T. F. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Four-wave+mixing+in+photonic+crystal+waveguides:+slow+light+enhancement+and+limitations.">Four-wave mixing in photonic crystal waveguides: slow light enhancement and limitations.</a> Opt. Express. 19 (5), 4458-4463 (2010).</li><li>Checoury, X., Han, Z., Boucaud, P. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Stimulated+Raman+scattering+in+silicon+photonic+crystal+waveguides+under+continuous+excitation.">Stimulated Raman scattering in silicon photonic crystal waveguides under continuous excitation.</a> Phys. Rev. B. 82 (4), 041308 (2010).</li><li>Y, <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Photonic+crystal+nanocavity+laser+with+a+single+quantum+dot+gain.">Photonic crystal nanocavity laser with a single quantum dot gain.</a> Opt. Express. 17 (18), 15975-15982 (2009).</li><li>Ellis, B., Mayer, M. 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F., McNab, S. J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Active+control+of+slow+light+on+a+chip+with+photonic+crystal+waveguides.">Active control of slow light on a chip with photonic crystal waveguides.</a> Nature. 438, 65-69 (2005).</li><li>Gomez-Iglesias, A., O'Brien, D., O'Faolain, L., Miller, A., Krauss, T. F. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Direct+measurement+of+the+group+index+of+photonic+crystal+waveguide+via+Fourier+transform+spectral+interferometry.">Direct measurement of the group index of photonic crystal waveguide via Fourier transform spectral interferometry.</a> Appl. Phys. Lett. 90 (26), 261107 (2007).</li><li>Akahane, Y., Asano, T., Song, B. -. S., Noda, S. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=High-Q+photonic+nanocavity+in+a+two-dimensional+photonic+crystal.">High-Q photonic nanocavity in a two-dimensional photonic crystal.</a> Nature. 425, 944-947 (2003).</li><li>McCutcheon, M. W., Rieger, G. W., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Resonant+scattering+and+second-harmonic+spectroscopy+of+planar+photonic+crystal+microcavities.">Resonant scattering and second-harmonic spectroscopy of planar photonic crystal microcavities.</a> Appl. Phys. Lett. 87 (22), 221110 (2005).</li><li>Galli, M., Portalupi, S. L., Belotti, M., Andreani, L. C., O'Faolain, L., Krauss, T. 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샘플 제조 전자 - 빔 (예 : ZEP 520A) 저항 우리의 선택은 동시에 고해상도 및 에칭 저항 때문입니다. 우리는 ZEP의 520A는 오버 헤드 연구소 등으로부터 방출 된 UV 빛에 의해 영향을받을 수 있습니다 생각, 같은 우리가 한 실험실에서 다른로 이동하는 동안 UV 불투명 한 용기에 스핀 코팅 샘플을 놓는 것이 좋습니다. 이 샘플 단계로 인해이며, 진공 챔버 없...

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	<tbody>
		<tr>
			<td>Name </td>
			<td>Company </td>
			<td>Catalogue number </td>
			<td>Comments (optional) </td>
		</tr>
		<tr>
			<td>Acetone</td>
			<td>Fisher Scientific</td>
			<td>A/0520/17</td>
			<td>CAUTION: flammable, use good ventilation and avoid all ignition sources.</td>
		</tr>
		<tr>
			<td>Isopropanol</td>
			<td>Fisher Scientific</td>
			<td>P/7500/15</td>
			<td>CAUTION: flammable, use good ventilation and avoid all ignition sources.</td>
		</tr>
		<tr>
			<td>Electron Beam resist</td>
			<td>Marubeni Europe plc.</td>
			<td>ZEP520A</td>
			<td>CAUTION: flammable, harmful by inhalation, avoid contact with skin and eyes.</td>
		</tr>
		<tr>
			<td>Xylene</td>
			<td>Fisher Scientific</td>
			<td>X/0100/17</td>
			<td>CAUTION: flammable and highly toxic, use good ventilation, avoid all ignition sources, avoid contact with skin and eyes.</td>
		</tr>
		<tr>
			<td>Microposit S1818 G2</td>
			<td>Chestech Ltd.</td>
			<td>10277866</td>
			<td>CAUTION: flammable and causes irritation to eyes, nose and respiratory tract.</td>
		</tr>
		<tr>
			<td>Microposit Developer MF-319</td>
			<td>Chestech Ltd.</td>
			<td>10058721</td>
			<td>CAUTION: alkaline liquid and can cause irritation to eyes, nose and respiratory tract.</td>
		</tr>
		<tr>
			<td>Hydrofluoric Acid</td>
			<td>Fisher Scientific</td>
			<td>22333-5000</td>
			<td>CAUTION: extremely corrosive, readily destroys tissue; handle with full personal protective equipment rated for HF.</td>
		</tr>
		<tr>
			<td>Microposit 1165 Remover</td>
			<td>Chestech Ltd.</td>
			<td>10058734</td>
			<td>CAUTION: flammable and causes irritation to eyes, nose and respiratory tract.</td>
		</tr>
		<tr>
			<td>Sulphuric Acid</td>
			<td>Fisher Scientific</td>
			<td>S/9120/PB17</td>
			<td>CAUTION: corrosive and very toxic; handle with personal protective equipment and avoid inhalation of vapours or mists.</td>
		</tr>
		<tr>
			<td>Hydrogen Peroxide</td>
			<td>Fisher Scientific</td>
			<td>BPE2633-500</td>
			<td>CAUTION: very hazardous in case of skin and eye contact; handle with personal protective equipment.</td>
		</tr>
		<tr>
			<td>&nbsp;</td>
			<td>&nbsp;</td>
			<td>&nbsp;</td>
			<td>Equipment</td>
		</tr>
		<tr>
			<td>Silicon-on-Insulator wafer</td>
			<td>Soitec</td>
			<td>G8P-110-01</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Diamond Scribe</td>
			<td>J &amp; M Diamond Tool Inc.</td>
			<td>HS-415</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Microscope slides</td>
			<td>Fisher Scientific</td>
			<td>FB58622</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Beakers</td>
			<td>Fisher Scientific</td>
			<td>FB33109</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Tweezers</td>
			<td>SPI Supplies</td>
			<td>PT006-AB</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Ultrasonic Bath</td>
			<td>Camlab</td>
			<td>1161436</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Spin-Coater</td>
			<td>Electronic Micro Systems Ltd.</td>
			<td>EMS 4000</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Pipette</td>
			<td>Fisher Scientific</td>
			<td>FB55343</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>E-beam Lithography System</td>
			<td>Raith Gmbh</td>
			<td>Raith 150</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Reactive Ion Etching System</td>
			<td>Proprietary In-house Designed</td>
			<td>--</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>UV Mask Aligner</td>
			<td>Karl Suss</td>
			<td>MJB-3</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>ASE source</td>
			<td>Amonics</td>
			<td>ALS-CL-15-B-FA</td>
			<td>CAUTION: invisible IR radiation.</td>
		</tr>
		<tr>
			<td>Single mode fibers</td>
			<td>Thorlabs</td>
			<td>P1-SMF28E-FC-2</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>3 dB fiber splitters</td>
			<td>Thorlabs</td>
			<td>C-WD-AL-50-H-2210-35-FC/FC</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Aspheric lenses</td>
			<td>New Focus</td>
			<td>5720-C</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>XYZ stages</td>
			<td>Melles Griot</td>
			<td>17AMB003/MD</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Polarizing beamsplitter cube</td>
			<td>Thorlabs</td>
			<td>PBS104</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>IR detector</td>
			<td>New Focus</td>
			<td>2033</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>100&times; Objective</td>
			<td>Nikon</td>
			<td>BD Plan 100x</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Oscilloscope</td>
			<td>Tektronix</td>
			<td>TDS1001B</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Optical Spectrum Analyzer</td>
			<td>Advantest</td>
			<td>Q8384</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>IR sensor card</td>
			<td>Newport</td>
			<td>F-IRC2</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>TLS source</td>
			<td>Agilent</td>
			<td>81940A</td>
			<td>CAUTION: invisible IR radiation.</td>
		</tr>
		<tr>
			<td>IR Camera</td>
			<td>Electrophysics</td>
			<td>7290A</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>IR Detector</td>
			<td>New Focus</td>
			<td>2153</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Digital Multimeter</td>
			<td>Agilent</td>
			<td>34401A</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Illumination</td>
			<td>Stocker Yale</td>
			<td>Lite Mite</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Monochromator</td>
			<td>Spectral Products</td>
			<td>DK480</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>Array Detector</td>
			<td>Andor</td>
			<td>DU490A-1.7</td>
			<td>&nbsp;</td>
		</tr>
		<tr>
			<td>GIF Fiber</td>
			<td>Thorlabs</td>
			<td>31L02</td>
			<td>&nbsp;</td>
		</tr>
	</tbody>
</table>

fabrication and characterization of photonic crystal slow light waveguides and cavities

느린 빛은보기의 기본 시점에서하고 실용적인 응용 프로그램을위한 상당한 잠재력이 모두에 큰 관심을 생성, 지난 10 년 동안 포토닉스 커뮤니티에서 뜨거운 주제 중 하나입니다. 느린 빛을 광자 크리스탈 waveguides는 특히 주요 부분을 연주하고 성공적으로 광 신호를 1-4 지연 고용하고 있으며 모두 선형 5-7과 비선형 장치의 강화. 8-11 광자 크리스탈 충치가 느린 빛 waveguides의와 유사한 효과를 얻을 수 있지만, 밴드 폭 감소 이상. 이러한 충치는 광학 12의 실현을 위해, 높은 Q-factor/volume 비율을 제공하며, 전기적으로 13 초저 임계 레이저와 비선형 효과의 향상을 펌프. 14-16을 또한 수동 필터 17 변조기 18-19 입증 된을 매우 좁은 라인 폭, 높은 자유 스펙트럼 R을 전시낮은 에너지 소비의 엔지 및 레코드 값입니다. 이러한 흥미로운 결과를 달성하기 위해 강력한 반복적 인 제조 프로토콜 개발해야합니다. 이 논문에서 우리는 광자 크리스탈 패턴의 정의에 대해 전자 - 빔 리소그래피 직원을 고용하고 있으며 습식 및 건식 에칭 기술을 사용하여 우리의 제조 프로토콜에서 심층적 인을 살펴보십시오. 수직으로 고생하지 않는 광자 결정에서의 최적화 된 제조 레시피 결과는 비대칭와 아주 좋은 가장자리 벽 거칠기를 나타냅니다. 우리는 유사한 문제를 파악하고 제거하기 위해 촬영 할 수있는 진단 경로로 이어지는, 에칭 매개 변수와 그 장치에 미칠 수있는 해로운 효과를 다양한 결과를 논의합니다. 느린 빛 waveguides을 평가하기위한 핵심은 전송 및 그룹 인덱스 스펙트럼의 수동적 특성입니다. 다양한 방법 특히 전송 스펙트럼 20-21의 파브리 · 페로 가장자리를 해결,보고되었습니다D 간섭 기술. 여기 22-25, 우리는 푸리에 변환 분석과 스펙트럼 간섭 측정법을 결합 직접, 광대역 측정 기술을 설명합니다. 우리가 액세스 waveguides와 노출 된 광자 크리스탈을 특징 수 있기 때문에 26 우리의 방법은 그 단순성과 능력에 띄는 필요없이 온칩 간섭 구성 요소 및 설치에 대해서만 부품 및 지연 검사를 이동 필요가 없습니다, 마하 - Zehnder 간섭계로 구성되어 있습니다. 언제 특성화 광자 크리스탈 충치, 직접 캐비티 자체의 성능에 구멍 27 미치는 영향에 연결된 내부 소스 21 외부 waveguides을 포함한 기술,이를 왜곡 측정. 여기, 우리는 간 양극화 프로브 빔의 사용을하고 프로브가 비행기 -의 목적을 통해 캐비티로 연결된다 공진 산란 (RS)로 알려져 소설 및 비 관입 기법을 설명합니다. 이 기술은 먼저 demonstra했습니다테드 McCutcheon 외. (28)에 의해 추가로 Galli 외에 의해 개발. 29

Fabricated samples
Figure 1 shows a scanning electron microscope (SEM) image of an exposed and developed pattern in electron beam resist - it is evident from the "clean" edge between the resist and the silicon substrate that complete exposure/development has been accomplished. Exposure of dose test patterns, consisting of simple repeated shapes (in our case 50 &times; 50 &mu;m squares), each with a differing base dose, are used to determine the correct dose factor and developmen...

Watch this Scientific Journal Video about Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities at JoVE.com

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities

광자 크리스탈 느린 빛 waveguides와 충치의 사용하는 것은 널리 많은 서로 다른 응용 프로그램에서 포토닉스 커뮤니티에 의해 채택되었습니다. 이러한 장치의 따라서 제조 및 특성 좋은 관심입니다. 간섭 (waveguides)와 공진 산란 (충치) :이 논문은 즉 우리의 제조 기술과 두 광 특성화 방법을 설명합니다.

광자 크리스탈 느린 경 Waveguides 그리고 안의 공간의 제조 및 특성

Slow light has been one of the hot topics in the photonics community in the past decade, generating great interest both from a fundamental point of view ...

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