Name: concurrent quantitative conductivity and mechanical properties measurements of organic photovoltaic materials using afm
Uploaded: 2013-01-23T13:00:00
Description: Watch this Scientific Journal Video about Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM at JoVE.com

MPN er taknemmelig for direktørens Fellowship Program for finansiel støtte. MPN ønsker at takke Yu-Chih Tseng for at få hjælp med udvikling af protokollen for solcelle behandling. Dette arbejde blev udført ved Center for nanoskala materialer, en US Department of Energy, Office of Science, Office of Basic Energy Sciences User Facility under kontrakt nr. DE-AC02-06CH11357.

1. Signal Acquisition <ol class="lalpha"><li> Installer prøve (plastsolceller uden katode (ITO / PEDOT: PSS/P3HT: PC 61 BM)) til en kommerciel Multimode AFM (Veeco, Santa Barbara, CA) udstyret med Nanoscope-V controller. </li><li> Installer ledende AFM sonde ind i Multimode AFM probe holder. </li><li> Skabe elektrisk forbindelse mellem AFM probe, prøve og spændingskilde. </li><li> Rute strømforstærker output (strømsignal), Multimode AFM udbøjning output (force signal), Multimode AFM prøve højde out...

<ol>
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P., Darling, S. B. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Improved+conductive+atomic+force+microscopy+measurements+on+organic+photovoltaic+materials+via+mitigation+of+contact+area+uncertainty.">Improved conductive atomic force microscopy measurements on organic photovoltaic materials via mitigation of contact area uncertainty.</a> Progress in Photovoltaics: Research and Applications. , (2012).</li><li>Li, H. -. C., Rao, K. K., Jeng, J. -. Y., Hsiao, Y. -. J., Guo, T. -. F., Jeng, Y. -. R., Wen, T. -. 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Nylige gennembrud i power omdannelseseffektivitet (PCE) af organisk solcelle (OPV) celler (skubbe 10% på celleniveau) 3 i koncert med overholdelse high-throughput og billig fremstillingsprocesser 4 har bragt en spotlight på OPV teknologi som en mulig løsning på den udfordring, billig fremstilling af store flader solceller. OPV materialer er iboende inhomogen i nanometerskala. Nanoscale inhomogenitet af OPV materialer og ydeevne af fotovoltaiske enheder er intimt forbundet. Således forståelse inhomogenitet i sammensætning samt elektriske egenskaber af OPV materialer er af afgørende betydning for at flytte OPV teknologi fremad. Atomic force mikroskopi (AFM) er blevet udviklet som et værktøj til høj opløsning målinger af overfladetopografi siden 1986. 5 dag teknikker til materialer egenskaber (Youngs modul, 6-10 arbejdsfunktion, 11 adfærdivity, 12 elektromekanik, 13-15 etc.) målinger stigende opmærksomhed. I tilfælde af OPV materialer, har korrelation med lokalt fasesammensætning og elektriske egenskaber lovende for at afsløre en bedre forståelse af de indre funktioner af organiske solceller. 1, 16-17 AFM-baserede teknikker er i stand til høj opløsning fasen tilskrivning 8 samt som elektriske egenskaber kortlægning i polymere materialer. Således i princippet er korrelationen mellem polymerfase sammensætning (ved mekaniske målinger) 18 og elektriske egenskaber muligt ved hjælp af AFM-baserede teknikker. Mange AFM-baserede teknikker til måling af mekaniske og elektriske egenskaber ved materialer bruger antagelsen om konstant areal for kontakt mellem AFM probe og overfladen. Denne antagelse ofte ikke, hvilket resulterer i stærk korrelation mellem overfladetopografi og mekaniske / elektriske egenskaber. For nylig, en ny AFM-baseret teknik tilhigh-throughput målinger af mekaniske egenskaber (PeakForce) 19 blev indført. PeakForce TUN (variation af PeakForce metode) skaber en platform for samtidige målinger af mekaniske og elektriske egenskaber ved prøve. Men PeakForce TUN metode producerer mekaniske og elektriske ejendom kort, som normalt er stærkt korreleret pga. forsvundet variabilitet i kontakt under målingerne. I denne artikel præsenterer vi en forsøgsprotokol til fjernelse af korrelationer, der er forbundet med varierende kontakt radius samtidig opretholde nøjagtige målinger af de mekaniske og elektriske egenskaber ved hjælp af AFM. Gennemførelse af protokollen resulterer i kvantitative målinger af materialers modstand og Youngs Modulus.

<table border="1"><tbody><tr><td> Navn på reagens / Material </td><td> Firma </td><td> Catalog Number </td><td> Kommentarer </td></tr><tr><td> Plextronics blæk </td><td> Plexcore </td><td> PV 1000 </td><td></td></tr><tr><td> ITO-overtrukne glassubstrater </td><td> Delta Technologies, Inc </td><td></td><td> 25 ohm / kvadrat </td></tr><tr><td> 30 MHz syntetiseret funktionsgenerator </td><td> Stanfor Research Systems </td><td> DS345 </td><td></td></tr><tr><td> Strømforstærker </td><td> Femto </td><td> DLPCA-200 </td><td></td></tr><tr><td> Multimode AFM </td><td> Veeco, Santa Barbara, Californien </td><td></td><td> udstyret med Nanoscope-V controller </td></tr><tr><td> DAQ-kort </td><td> National Instruments </td><td> NI-PCI-6115 </td><td></td></tr><tr><td> Metal Pt prober </td><td> RMNano </td><td> 12Pt3008 </td><td></td></tr><tr><td> MATLAB software </td><td> MathWorks </td><td></td><td></td></tr><tr><td> LabView software </td><td> National Instruments </td><td></td><td></td></tr></tbody></table>

concurrent quantitative conductivity and mechanical properties measurements of organic photovoltaic materials using afm

Organiske solceller (OPV) materialer er i sagens natur inhomogen på nanometer skala. Nanoscale inhomogenitet af OPV materialer påvirker udførelsen af ​​solceller enheder. Således forståelse af rumlige variationer i sammensætning samt elektriske egenskaber af OPV materialer er af afgørende betydning for at flytte PV teknologi fremad. 1,2 I dette papir, beskriver vi en protokol for kvantitative målinger af elektriske og mekaniske egenskaber af OPV materialer med sub -100 nm opløsning. I øjeblikket materialeegenskaber målinger udført ved anvendelse af kommercielt tilgængelige AFM-baserede teknikker (PeakForce, ledende AFM) generelt kun kvalitative data. Værdierne for modstand såvel som Youngs modul, målt ved hjælp af vores metode på den prototypiske ITO / PEDOT: PSS/P3HT: PC 61 BM-systemet i god overensstemmelse med litteraturdata. Den P3HT: PC 61 BM blanding adskiller på PC 61 BM-rige og P3HT-rige domains. Mekaniske egenskaber for PC 61 BM-rige og P3HT-rige domæner er forskellige, hvilket tillader domæne tildeling på overfladen af filmen. Vigtigere, kombinerer mekaniske og elektriske data tillader korrelation af domænestruktur på overfladen af ​​filmen med elektriske egenskaber variation måles gennem tykkelsen af ​​filmen.

Youngs modul og resistivitet kort (figur 3) viser typiske måleresultater beskrevet ovenfor. Mekaniske og elektriske egenskaber af ITO / PEDOT: PSS/P3HT: PC 61 BM stack blev målt ved negativ (-10 V) og positive (6 V) spændinger påføres på AFM probe. Billeddannende artefakter, der er forbundet med elektrostatisk interaktion mellem AFM proben og prøven, er et fælles problem for kvantitative målinger af funktionelle egenskaber ved hjælp af AFM. Ligheden af ​​Youngs moduli størrelse...

Watch this Scientific Journal Video about Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM at JoVE.com

Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM

Organiske solceller (OPV) materialer er i sagens natur inhomogen på nanometer skala. Nanoscale inhomogenitet af OPV materialer påvirker udførelsen af ​​solceller enheder. I denne artikel beskriver vi en protokol for kvantitative målinger af elektriske og mekaniske egenskaber af OPV materialer med sub-100 nm opløsning.

Samtidig Kvantitativ Ledningsevne og mekaniske egenskaber Målinger af organiske solceller materialer ved hjælp af AFM

Organic photovoltaic  (OPV) materials are inherently inhomogeneous at the nanometer scale. Nanoscale  inhomogeneity of OPV materials affects performance ...

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