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DOI :
10.3791/50376-v
April 22nd, 2013
Chapters
0:05
Title
2:29
Sample Fabrication for Atom Probe Tomography Analysis
5:43
Atom Probe Tomography Analysis in a CAMECA LEAP 3000X HR System
6:31
Reconstruction of Atom Probe Tomography Data
7:13
Results: Elemental Maps and Concentration Depth Profiles of a Grain Boundary
8:38
Conclusion
在这项工作中,我们描述了使用的原子探针层析成像技术研究中的CIGS型太阳能电池的吸收层的晶粒边界。这里也提出一种新颖的方法来准备包含所需的晶界结构与已知的原子探针提示。
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