Name: atom probe tomography studies on the cu(in,ga)se2 grain boundaries
Uploaded: 2013-04-22T12:00:00
Description: Watch this Scientific Journal Video about Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries at JoVE.com

Dette arbejde er grundlagt af den tyske Research Foundation (DFG) (Contract CH 943/2-1). Forfatterne vil gerne takke Wolfgang Dittus og Stefan Paetel fra Zentrum für Sonnenenergie-und Wasserstoff-Forschung Baden-Württemberg for at forberede CIGS absorberlag for dette arbejde.

1.. CIGS Layer Deposition <ol><li> Sputter-depositum 500 nm af molybdæn (back kontakt layer) på et 3 mm tykt natronkalkglas substrat (SLG). </li><li> Co-fordampe 2 um CIGS i et inline flertrins CIGS proces 24.. De opnåede CIGS lag aflejret på Mo tilbage kontakt er vist i figur 1.. </li><li> Mål den integrerede sammensætning CIGS lag af X-ray fluorescens spektrometri (XRF). Det opnåede CIGS sammensætning er vist i tabel 1.. </li></ol> 2.. Stedss...

<ol>
	<li>Stanbery, B. J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Copper+indium+selenides+and+related+materials+for+photovoltaic+devices.">Copper indium selenides and related materials for photovoltaic devices.</a> Crit. Rev. Solid State. 27, 73-117 (2002).</li><li>Kemell, M., Ritala, M., Leskel&#228;, M. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Thin+film+deposition+methods+for+CuInSe2+solar+cells.">Thin film deposition methods for CuInSe2 solar cells.</a> Crit. Rev. Solid State. 30, 1-31 (2005).</li><li>Kazmerski, L. L. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Solar+photovoltaics+R&amp;D+at+the+tipping+point:+a+2005+technology+overview.">Solar photovoltaics R&amp;D at the tipping point: a 2005 technology overview.</a> J. Electron Spectrosc. 150 (2-3), 105-135 (2006).</li><li>Sadewasser, S., Glatzel, T., Schuler, S., Nishiwaki, S., Kaigawa, R., Lux-Steiner, M. C. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Kelvin+probe+force+microscopy+for+the+nano+scale+characterization+of+chalcopyrite+solar+cell+materials+and+devices.">Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices.</a> Thin Solid Films. 431-432, 257-261 (2003).</li><li>Jiang, C. S., Noufi, R., AbuShama, J. A., Ramanathan, K., Moutinho, H. R., Pankow, J., Al-Jassim, M. M. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Local+built-in+potential+on+grain+boundary+of+Cu(In,Ga)Se2+thin-films.">Local built-in potential on grain boundary of Cu(In,Ga)Se2 thin-films.</a> Appl. Phys. Lett. 84, 3477-1-3477-3 (2004).</li><li>Abou-Ras, D., Koch, C. T., K&#252;stner, V., van Aken, P. A., Jahn, U., Contreras, M. A., Caballero, R., Kaufmann, C. A., Scheer, R., Unold, T., Schock, H. W. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Grain-boundary+types+in+chalcopyrite-type+thin+films+and+their+correlations+with+film+texture+and+electrical+properties.">Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties.</a> Thin Solid Films. 517, 2545-2549 (2009).</li><li>Nichterwitz, M., Abou-Ras, D., Sakurai, K., Bundesmann, J., Unold, T., Scheer, R., Schock, H. W. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Influence+of+grain+boundaries+on+current+collection+in+Cu(In,Ga)Se2+thin-film+solar+cells.">Influence of grain boundaries on current collection in Cu(In,Ga)Se2 thin-film solar cells.</a> Thin Solid Films. 517, 2554-2557 (2009).</li><li>Abou-Ras, D., Schorr, S., Schock, H. W. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Grain+sizes+and+grain+boundaries+in+chalcopyrite-type+thin+films.">Grain sizes and grain boundaries in chalcopyrite-type thin films.</a> J. Appl. Cryst. 40, 841-848 (2007).</li><li>Niles, D. W., Al-Jassim, M., Ramanathan, K. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Direct+observation+of+Na+and+O+impurities+at+grain+surfaces+of+CuInSe2+thin+films.">Direct observation of Na and O impurities at grain surfaces of CuInSe2 thin films.</a> J. Vac. Sci. Technol. A. 17, 291-296 (1998).</li><li>Rockett, A., Granath, K., Asher, S., Al Jassim, M. M., Hasoon, F., Matson, R., Basol, B., Kapur, V., Britt, J. S., Gillespie, T., Marshall, C. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Na+incorporation+in+Mo+and+CuInSe2+from+production+processes.">Na incorporation in Mo and CuInSe2 from production processes.</a> Sol. Energy. 59, 255-264 (1999).</li><li>Heske, C., Eich, D., Fink, R., Umbach, E., Kakar, S., van Buuren, T., Bostedt, C., Terminello, L. J., Grush, M. M., Callcott, T. A., Himpsel, F. J., Ederer, D. L., Perera, R. C. C., Riedl, W., Karg, F. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Localization+of+Na+impurities+at+the+buried+CdS/Cu(In,+Ga)Se2+heterojunction.">Localization of Na impurities at the buried CdS/Cu(In, Ga)Se2 heterojunction.</a> Appl. Phys. Lett. 75, 2082-2084 (1999).</li><li>Braunger, D., Hariskos, D., Bilger, G., Rau, U., Schock, H. W. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Influence+of+Na+on+the+growth+of+polycrystalline+Cu(In,Ga)Se2+thin+films.">Influence of Na on the growth of polycrystalline Cu(In,Ga)Se2 thin films.</a> Thin Solid Films. 361, 161-166 (2000).</li><li>Cerezo, A., Godfrey, T. J., Sijbrandij, S. J., Smith, G. D. W., Warren, P. J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Performance+of+an+energy-compensated+three-dimensional+atom+probe.">Performance of an energy-compensated three-dimensional atom probe.</a> Rev. Sci. Instrum. 69, 49-58 .</li><li>Blavette, D., Bostel, A., Sarrau, J. M., Deconihout, B., Menand, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=An+atom-probe+for+three+dimensional+tomography.">An atom-probe for three dimensional tomography.</a> Nature. 363, 432-435 (1993).</li><li>Gault, B., Vurpillot, F., Vella, A., Gilbert, M., Menand, A., Blavette, D., Deconihout, B. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Design+of+a+femtosecond+laser+assisted+tomographic+atom+probe.">Design of a femtosecond laser assisted tomographic atom probe.</a> Rev. Sci. Instrum. 77, 043705-1-043705-8 (2006).</li><li>Kelly, T. F., Miller, M. K. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Atom+probe+tomography.">Atom probe tomography.</a> Rev. Sci. Instrum. 78, 031101-1-031101-20 (2007).</li><li>Thompson, K., Lawrence, D., Larson, D. J., Olson, J. D., Kelly, T. F., Gorman, B. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=In+situ+site-specific+specimen+preparation+for+atom+probe+tomography.">In situ site-specific specimen preparation for atom probe tomography.</a> Ultramicroscopy. 107 (2-3), 131-139 (2007).</li><li>Cadel, E., Barreau, N., Kessler, J., Pareige, P. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Atom+probe+study+of+sodium+distribution+in+polycristalline+Cu(In,Ga)Se2+thin+film.">Atom probe study of sodium distribution in polycristalline Cu(In,Ga)Se2 thin film.</a> Acta Material. 58, 2634-2637 (2010).</li><li>Schlesiger, R., Oberdorfer, C., W&#252;rz, R., Greiwe, G., Stender, P., Artmeier, M., Pelka, P., Spaleck, F., Schmitz, G. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Design+of+a+laser-assisted+tomographic+atom+probe+at+M&#252;nster+University.">Design of a laser-assisted tomographic atom probe at M&#252;nster University.</a> Rev. Sci. Instr. 81, 043703 (2010).</li><li>Cojocaru-Mir&#233;din, O., Choi, P., Abou-Ras, D., Schmidt, S. S., Caballero, R., Raabe, D. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Characterization+of+grain+boundaries+in+Cu(In,Ga)Se2+films+using+atom-probe+tomography.">Characterization of grain boundaries in Cu(In,Ga)Se2 films using atom-probe tomography.</a> IEEE J. Photovolt. 1 (2), 207-212 (2011).</li><li>Cojocaru-Mir&#233;din, O., Choi, P., Wuerz, R., Raabe, D. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Atomic-scale+characterization+of+the+CdS/CuInSe2+interface+in+thin-film+solar+cells.">Atomic-scale characterization of the CdS/CuInSe2 interface in thin-film solar cells.</a> Appl. Phys. Lett. 98, 103504-1-103504-3 (2011).</li><li>Couzinie-Devy, F., Cadel, E., Barreau, N., Arzel, L., Pareige, P. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Atom+probe+study+of+Cu-poor+to+Cu-rich+transition+during+Cu(In,Ga)Se2+growth.">Atom probe study of Cu-poor to Cu-rich transition during Cu(In,Ga)Se2 growth.</a> Appl. Phys. Lett. 99, 232108-1-232108-3 (2011).</li><li>Voorwinden, G., Jackson, P., Kniese, R., Powalla, M. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=In-line+Cu(In,Ga)Se2+co-evaporation+process+on+30+cm+x+30+cm+substrates+with+multiple+deposition+stages.">In-line Cu(In,Ga)Se2 co-evaporation process on 30 cm x 30 cm substrates with multiple deposition stages.</a> , 2115-2118 (2007).</li><li>Miller, M. K., Russell, K. F., Thompson, K., Alvis, R., Larson, D. J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Review+of+atom+probe+FIB-based+specimen+preparation+methods.">Review of atom probe FIB-based specimen preparation methods.</a> Microscopy Microanal. 13 (6), 428-436 (2007).</li><li>J, D. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Modeling+image+distortions+in+3DAP.">Modeling image distortions in 3DAP.</a> Microscopy and Microanalysis. 10 (3), 384-390 (2008).</li><li>Kellog, G. L. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Determining+the+field+emitter+temperature+during+laser+irradiation+in+the+pulsed+laser+atom+probe.">Determining the field emitter temperature during laser irradiation in the pulsed laser atom probe.</a> J. Appl. Phys. 52, 5320 (1981).</li><li>. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> IVASTM 3.6.2 User Guide 2012. , (2012).</li><li>Persson, C., Zunger, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Compositionally+induced+valence-band+offset+at+the+grain+boundary+of+polycrystalline+chalcopyrites+creates+a+hole+barrier.">Compositionally induced valence-band offset at the grain boundary of polycrystalline chalcopyrites creates a hole barrier.</a> Appl. Phys. Lett. 87, 211904-1-211904-3 (2005).</li><li>Zhang, S. B., Wei, S. -. H., Zunger, A., Katayama-Yoshida, H. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Defect+physics+of+the+CuInSe2+chalcopyrite+semiconductor.">Defect physics of the CuInSe2 chalcopyrite semiconductor.</a> Phys. Rev. B. 57, 9642-9656 (1998).</li><li>Cahn, J. W., Johnson, W. C., Blakely, J. M. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Interfacial Segregation. , 3-23 (1979).</li><li>Miller, M. K., Jayaram, R. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Some+factors+affecting+analysis+in+atom+probe.">Some factors affecting analysis in atom probe.</a> Surf. Sci. 266, 458-462 (1992).</li><li>Wuerz, R., Eicke, A., Kessler, F., Paetel, S., Efimenko, S., Schlegel, C. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=CIGS+thin-film+solar+cells+and+modules+on+enamelled+steel+substrates.">CIGS thin-film solar cells and modules on enamelled steel substrates.</a> Sol. Energy. 100, 132-137 (2012).</li><li>De Geuser, F., Lefebvre, W., Danoix, F., Vurpillot, F., Forbord, B., Blavette, D. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=An+improved+reconstruction+procedure+for+the+correction+of+local+magnification+effects+in+three-dimensional+atom-probe.">An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe.</a> Surf. Interf. Anal. 39, 268-272 (2007).</li><li>Kingham, D. R. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=The+post-ionization+of+field+evaporated+ions:+A+theoretical+explanation+of+multiple+charge+states.">The post-ionization of field evaporated ions: A theoretical explanation of multiple charge states.</a> Surf. Sci. 116, 273-301 (1982).</li><li>Letellier, L. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Etude des joints de grains et interphases dans les superalliages Astroloy par microscopie electronique et tomographie atomique [dissertation]. , (1994).</li><li>Hoummada, I., Mangelinck, K., Chow, D., Lee, J., Bernardini, <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Original+methods+for+diffusion+measurements+in+polycrystalline+thin-films.">Original methods for diffusion measurements in polycrystalline thin-films.</a> Defect and Diffusion Forum. 322, 129-150 (2012).</li></ol>

I den nuværende arbejde har vi præsenteret APT resultater på en tilfældig HAGB i CIGS, en sammensat halvleder, der anvendes til solcelle ansøgning. Desuden har vi også vist, at APT i forbindelse med supplerende teknikker, såsom EBSD og TEM, er et kraftfuldt værktøj til at belyse strukturen-sammensætningen egenskaber forhold til CIGS solceller. Desværre viser overensstemmelsen mellem APT og EDX / ål i TEM var ikke mulig, fordi det første EDX / ÅL har ikke tilstrækkelig opløsning til at detektere lave Na o...

<html> Thin-film solceller baseret på chalkopyrit struktureret sammensat halvleder Cu (I, Ga) Se 2 (CIGS) som absorber materiale har været under udvikling i mere end to årtier på grund af deres høje effektivitet, stråling hårdhed, langsigtet stabil ydeevne og lave produktionsomkostninger 1-3. Disse solceller kan fremstilles med kun lidt materiale forbrug på grund af de gunstige optiske egenskaber CIGS absorberlag, nemlig en direkte bandgap og en høj absorptionskoefficient 1,2. Absorber film af kun nogle få mikrometer i tykkelse er tilstrækkelig til at frembringe en høj fotostrøm. Da diffusion stier photogenerated ladningsbærere til elektroderne er forholdsvis korte, kan CIGS absorbenter fremstilles i polykrystallinsk formular. Den maksimale effektiviteten af en Cu (I, Ga) Se 2 (CIGS) solcelle opnået hidtil er 20,4% 4, som er den højeste værdi blandt alle tyndfilm-solceller. ove_content &quot;&gt; For yderligere etablere CIGS tynd-film solcelle teknologi, både nedbringelse af produktionsomkostningerne og forbedring af solcelle effektivitet er afgørende. Sidstnævnte er stærkt afhængige af mikrostruktur og kemiske sammensætning af CIGS absorberlag. Interne grænseflader, navnlig korngrænser (GBS) i absorberen, spiller en afgørende rolle, da de kan påvirke transporten af ​​photogenerated ladningsbærere. Et af de vigtigste uløste problemer med hensyn til CIGS solceller er den godartede natur CIGS GBs, dvs polykrystallinske CIGS absorber film giver fremragende celle effektivitetsgevinster på trods af en høj tæthed af GBs og gitter defekter. Adskillige forfattere studeret GBs i solar-grade CIGS film med hensyn til deres elektriske egenskaber 5,6, karakter og misorientation 7-9 samt urenhed segregation 10-13. Men ingen klar sammenhæng mellem disse ejenes kunne etableres hidtil. Især er der en betydelig mangel på information om lokale kemiske sammensætning og urenheder af GBS. I de seneste to årtier har Atom Probe Tomography (APT) dukket op som en af de lovende nano-analyseteknikker 14-17. Indtil for nylig APT studier af solceller er stort set blevet begrænset af vanskeligheder i prøven forberedelsesprocessen og den begrænsede kapacitet til at analysere halvleder materialer ved hjælp af konventionelle pulserende spænding atom sonder. Disse begrænsninger er stort set blevet overvundet af udviklingen af &quot;lift-out-metoden&quot; baseret på fokuseret ion beam (FIB) fræsning 18 og indførelsen af pulserende laser APT 16. Adskillige papirer om APT karakterisering af CIGS solceller er blevet offentliggjort 19-23, som er stærkt opmuntrende for yderligere undersøgelser. Dette papir giver en rettesnor for, hvordan at studere interne interfaces i CIGS tynd-film solceller ved atom sonden tomografi teknik.

atom probe tomography studies on the cu(in,ga)se2 grain boundaries

I forhold til de eksisterende teknikker, er atom sonde tomografi en unik teknik i stand til kemisk karakterisere de interne grænseflader på nanoskala og i tre dimensioner. Faktisk APT har høj følsomhed (i størrelsesordenen ppm) og høj rumlig opløsning (sub nm). Betydelig indsats blev gjort her for at forberede en APT tip, der indeholder den ønskede korngrænse med en kendt struktur. Faktisk stedsspecifik prøveforberedelse ved kombineret fokuseret-ion-beam, elektron tilbagekastning diffraktion og transmissions elektron mikroskopi er præsenteret i dette arbejde. Denne metode giver udvalgte korngrænser med kendt struktur og placering i Cu (I, Ga) Se 2 tyndfilm, der skal undersøges for atom sonde tomografi. Endelig diskuterer vi fordele og ulemper ved at bruge atom sonden tomografi teknik til at undersøge korngrænserne i Cu (I, Ga) Se 2 tynd-film solceller.

Figur 3 viser et sidebillede (xz slice) elementært kort over tilfældige høj vinkel GB (HAGB) 28,5 ° - &lt;511&gt; cub valgt i figur 2 ved stedspecifik fremstillingsmetode. Co-adskillelse af Na, K og O på et CIGS HAGB afbildes direkte bruge APT. Disse urenheder sandsynligvis diffunderet ud af SLG substrat i absorberlaget under afsætningen af ​​CIGS lag ved ~ 600 ° C. 4a viser Cu, I, Ga og SE koncentration profiler tværs...

Watch this Scientific Journal Video about Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries at JoVE.com

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries

I dette arbejde beskriver vi anvendelsen af ​​atom-sonde tomografi teknik til undersøgelse af korngrænserne af absorberingslaget i en CIGS solcelle. En ny tilgang til at forberede atom probespidser indeholder det ønskede korngrænse med en kendt struktur er også præsenteret her.

Atom Probe tomografi Undersøgelser af Cu (I, Ga) Se<sub&gt; 2</sub&gt; Korngrænser

Compared with the existent techniques, atom probe tomography is a unique technique able to chemically characterize the internal interfaces at the ...

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Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries

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sondering C<sub&gt; 84</sub&gt; -embedded Si Underlag Brug Scanning Probe Microscopy og Molecular Dynamics

This paper reports an array-designed C84-embedded Si substrate fabricated using a controlled self-assembly method in an ultra-high vacuum chamber. The ...

Microfluidic Imaging Flow Cytometry by Asymmetric-detection Time-stretch Optical Microscopy (ATOM)

Microfluidic Imaging Flow Cytometry by Asymmetric-detection Time-stretch Optical Microscopy ATOM

Mikrofluidisk Imaging Flow Cytometry ved asymmetrisk detektion Time-stretch Optical Microscopy (ATOM)

Scaling the number of measurable parameters, which allows for multidimensional data analysis and thus higher-confidence statistical results, has been the ...

In Situ Monitoring of the Accelerated Performance Degradation of Solar Cells and Modules: A Case Study for Cu(In,Ga)Se2 Solar Cells

In Situ Monitoring of the Accelerated Performance Degradation of Solar Cells and Modules: A Case Study for CuIn,GaSe2 Solar Cells

In Situ Overvågning af accelereret ydeevne nedbrydning af solceller og moduler: en Case Study for Cu (i, Ga) Se2 solceller

The levelized cost of electricity (LCOE) of photovoltaic (PV) systems is determined by, among other factors, the PV module reliability. Better prediction ...

Fabrication of Magnetic Nanostructures on Silicon Nitride Membranes for Magnetic Vortex Studies Using Transmission Microscopy Techniques

Fabrikation af magnetiske nanostrukturer på Silicon Nitride membraner til magnetiske Vortex undersøgelser ved hjælp af Transmission mikroskopi-teknikker

Electron and x-ray magnetic microscopies allow for high-resolution magnetic imaging down to tens of nanometers. However, the samples need to be prepared ...

Fabrication of Robust Nanoscale Contact between a Silver Nanowire Electrode and CdS Buffer Layer in Cu(In,Ga)Se2 Thin-film Solar Cells

Fabrication of Robust Nanoscale Contact between a Silver Nanowire Electrode and CdS Buffer Layer in CuIn,GaSe2 Thin-film Solar Cells

Fabrikation af robust nanoskala kontakt mellem en sølv Nanowire elektrode og CdS buffer lag i Cu (in, GA) Se2 tynde film solceller

Silver nanowire transparent electrodes have been employed as window layers for Cu(In,Ga)Se2 thin-film solar cells. Bare silver nanowire electrodes ...