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DOI :
10.3791/50376-v
April 22nd, 2013
Chapters
0:05
Title
2:29
Sample Fabrication for Atom Probe Tomography Analysis
5:43
Atom Probe Tomography Analysis in a CAMECA LEAP 3000X HR System
6:31
Reconstruction of Atom Probe Tomography Data
7:13
Results: Elemental Maps and Concentration Depth Profiles of a Grain Boundary
8:38
Conclusion
이 작품에서 우리는 CIGS 태양 전지의 광 흡수층의 곡물 경계를 공부 원자 탐침 단층 촬영 기술의 사용을 설명합니다. 알려진 구조로 원하는 입자 경계를 포함하는 원자 프로브 팁을 준비하는 새로운 접근 방식도 여기에 표시됩니다.
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