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表面附近的高速粒子图像测速

DOI :

10.3791/50559-v

11:59 min

June 24th, 2013

June 24th, 2013

32,430 Views

1Department of Mechanical Engineering, University of Michigan

研究瞬变流边界附近,使用高分辨率,高速粒子图像测速(PIV)的一个过程。 PIV是一种非侵入式测量技术适用于任何光学访问的流量通过优化多个参数的限制,例如图像和记录性能,激光表属性,和分析算法。

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76 Micro PIV

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