Research
Education
Sign In
EN
EN - English
CN - 中文
DE - Deutsch
ES - Español
KR - 한국어
IT - Italiano
FR - Français
PT - Português
Please note that all translations are automatically generated. Click here for the English version.
DOI :
10.3791/51129-v
January 15th, 2014
Chapters
0:05
Title
1:27
Sample Preparation and Characterization
2:12
Spin Echo Resolved Grazing Incidence Scattering (SERGIS) Experiments
4:47
Results: Probing the Length Scales of PCBM Crystallites on Thin Film P3HT:PCBM
5:46
Conclusion
利用自旋回声解决放牧发生率散射(SERGIS)作为中子散射技术,探测不规则样品的长度尺度方面取得了进展。使用SERGIS技术对[6,6]-苯-C61-丁酸甲基酯的晶体进行了探测,结果经光学和原子力显微镜确认。
Tags
-- Views
Related Videos
Privacy
Terms of Use
Policies
Contact Us
Recommend to library
JoVE NEWSLETTERS
JoVE Journal
Methods Collections
JoVE Encyclopedia of Experiments
Archive
JoVE Core
JoVE Business
JoVE Science Education
JoVE Lab Manual
Faculty Resource Center
Authors
Overview
Publishing Process
Editorial Board
Scope and Policies
Peer Review
FAQ
Submit
Librarians
Testimonials
Subscriptions
Access
Resources
Library Advisory Board
ABOUT JoVE
Leadership
Copyright © 2024 MyJoVE Corporation. All rights reserved