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DOI :
10.3791/51344-v
June 16th, 2014
Chapters
0:05
Title
2:13
Mounting of COOH-SAM Surfaces on Gold for Soft Landing of Mass-selected Ions
3:07
Soft Landing of Mass-selected Ru(bpy)32+ onto COOH-SAM Surfaces
4:17
Analysis by In Situ TOF-SIMS Before and After Exposure to Reactive Gases
5:59
Analysis by In Situ FT-ICR-SIMS and IRRAS During and After Soft Landing
7:28
Results: Characterization of Organometallic Ions Soft Landed onto COOH-SAMs by In Situ SIMS and IR Spectroscopy
9:39
Conclusion
表面への質量選別イオンのソフトランディングは、新規材料の高度に制御された準備のための強力なアプローチである。 その場二次イオン質量分析法(SIMS)および赤外反射吸収分光法(IRRAS) 内での分析と相まって、ソフトランディングは、表面と明確に定義された種との相互作用に前例のない洞察を提供しています。
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