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DOI :
10.3791/53870-v
June 16th, 2016
Chapters
0:05
Title
1:14
Performance of Computed Tomography (CT) Scan
3:07
Micro Preparation
5:06
Light Microscopy (LM) Measurement Setup
6:15
Light Microscopy Characterization
7:16
Scanning Electron Microscopy (SEM) Analysis
8:32
Results: Comprehensive Micro-characterization of an Active Light Emitting Diode
9:49
Conclusion
一种有源光器件的全面的微特征的工作流程概述。它包含CT,LM和扫描电镜结构以及功能调查。该方法被证明为白色LED可仍然表征期间进行操作。
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