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Frank Tappe

Department Lippstadt

Hamm-Lippstadt University of Applied Sciences

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Hamm-Lippstadt University of Applied Sciences

JOVE ARTICLES

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

Jörg Meyer¹,

Christian Thomas¹,

Frank Tappe¹,

Tekie Ogbazghi¹

¹Department Lippstadt, Hamm-Lippstadt University of Applied Sciences

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