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DOI :
10.3791/53870-v
June 16th, 2016
Chapters
0:05
Title
1:14
Performance of Computed Tomography (CT) Scan
3:07
Micro Preparation
5:06
Light Microscopy (LM) Measurement Setup
6:15
Light Microscopy Characterization
7:16
Scanning Electron Microscopy (SEM) Analysis
8:32
Results: Comprehensive Micro-characterization of an Active Light Emitting Diode
9:49
Conclusion
光アクティブデバイスの総合的なマイクロ特徴付けのためのワークフローが概説されています。これは、CT、LMおよびSEMによる構造だけでなく、機能的な調査が含まれています。この方法は、まだ特徴付けの時に動作させることが可能白色LEDのために実証されています。
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