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DOI :
10.3791/54651-v
November 7th, 2016
Chapters
0:05
Title
0:43
Grow Single Crystals of TCDAP Using a Physical Vapor Transfer (PVT) System
1:43
Device Fabrication
4:09
Measure the Performance of the Device and Bending Experiments
5:32
Results: Measuring Properties of Bent Organic Electronic Devices
6:38
Conclusion
この原稿は、電子的特性測定のための機能デバイスを維持するために、有機単結晶ベースの電界効果トランジスタの曲げ方法を記載しています。結果は、曲げが結晶中のため、フレキシブルエレクトロニクスのに重要である充電ホッピングレート、中の分子間隔の変化を引き起こすことを示唆しています。
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