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DOI :
10.3791/54651-v
November 7th, 2016
Chapters
0:05
Title
0:43
Grow Single Crystals of TCDAP Using a Physical Vapor Transfer (PVT) System
1:43
Device Fabrication
4:09
Measure the Performance of the Device and Bending Experiments
5:32
Results: Measuring Properties of Bent Organic Electronic Devices
6:38
Conclusion
본 논문의 전자 특성 측정을위한 작동 장치를 유지하기위한 유기 단결정 기반 전계 효과 트랜지스터의 절곡 가공을 설명한다. 결과는 제안 그 결정의 분자 간격에 따라서 유연 전자에서 중요하다 충전 호핑 속도의 굽힘 원인 변경.
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