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DOI :
10.3791/55735-v
•
7:15 min
June 2nd, 2017
Chapters
0:05
Title
6:50
Conclusion
5:52
Results: In Situ Electromechanical Characterization of a Single-crystal Copper Specimen
0:45
Microfabrication of Silicon Frames
2:13
Laser Patterning of Metal Copper Specimens
3:38
Microdevice-based Electromechanical Testing Systems (MEMTS) Assembly
4:38
In Situ Transmission Electron Microscopy (TEM) Experiments
전기적 보조 변형 (EAD)에 대한 전기 및 열 영향을 분리하는 것은 거시적 인 샘플을 사용하여 매우 어렵습니다. 금속 샘플 마이크로 및 나노 구조와 함께 커스텀 테스트 절차가 개발되어이 샘플에서 주울 가열 및 전위 전개없이 형성에인가 된 전류의 영향을 평가했습니다.
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