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DOI :
10.3791/56371-v
February 4th, 2018
Chapters
0:00
Title
2:51
Selecting and Designing Optimum Structure
3:31
Modeling and Fabrication on CMOS
5:39
Device Testing: Thermal Camera Test for Embedded Heaters
6:27
Device Testing: Calibrating LDV and Test Setup
9:19
Device Testing: Testing 68μm Long MEMS Filters via LDV
10:32
Device Testing: Higher Mode Measurement
11:01
Avoiding Device Failures
11:45
Avoiding Failures: High Thermal Stress and Burning
12:10
Boosting The Tuning Capability
13:16
Results
14:07
Conclusion
レーザドップラ (LDV) は、チューニング、チューニング機能、および装置の故障や、ヘッドス ライダーの回避の修正周波数測定などを用いた固定固定ビーム設計プロトコルが表示されます。その高いモード機能によりネットワーク アナライザーに LDV 法の優位性を発揮します。
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