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评估植入物所引起的 MRI 伪影和脉冲序列易损性评估的协议

DOI :

10.3791/57394-v

May 17th, 2018

May 17th, 2018

9,510 Views

1Department of Neuroradiology, Heidelberg University Hospital, 2Department of Prosthodontics, Heidelberg University Hospital

我们描述了一种标准化的方法来评估植入物引起的磁共振成像工件, 以估计植入物对磁共振成像的适用性和/或不同脉冲序列对金属工件的易损性。同时。

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