Elemental-sensitive påvisning av kjemien i batterier gjennom myk X-ray absorpsjon spektroskopi og Resonant uelastisk X-ray spredning
April 17th, 2018
•Jinpeng Wu1,2, Shawn Sallis2,3, Ruimin Qiao2, Qinghao Li2,4, Zengqing Zhuo2,5, Kehua Dai2,6, Zixuan Guo2,7, Wanli Yang2
1Geballe Laboratory for Advanced Materials, Stanford University, 2Advanced Light Source, Lawrence Berkeley National Laboratory, 3Department of Materials Science and Engineering, Binghamton University, 4School of Physics, National Key Laboratory of Crystal Materials, Shandong University, 5School of Advanced Materials, Peking University Shenzhen Graduate School, 6School of Metallurgy, Northeastern University, 7Department of Chemical Engineering, University of California-Santa Barbara
Her presenterer vi en protokoll for typiske eksperimenter av myke X-ray absorpsjon spektroskopi (sXAS) og resonant uelastisk X-ray spredning (RIXS) med programmer i batteriet materiale studier.
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