Name: a standard and reliable method to fabricate two-dimensional nanoelectronics
Uploaded: 2018-08-28T13:00:00
Description: Watch this Scientific Journal Video about A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics at JoVE.com

Dette arbejde blev støttet af National Science Council, Taiwan kontrakt nr. DE FLESTE 105-2112-M-003-016-MY3. Dette arbejde blev også delvist støttet af nationale Nano enhed laboratorier og e-beam laboratorium i electrical engineering af National Taiwan University.

1. 2D kvasi-heterojunction transistorer fabrikationsproces
<ol><li>Forberede kommercielle c-plane sapphire.<ol>
<li>Vaske helt enkelt-side poleret sapphire (2 tommers) med acetone.</li>
		<li>Skyl safir bærematerialet med isopropylalkohol.</li>
	</ol></li>
	<li>Vokse MoS2 på safir substrat ved hjælp af CVD i en varm væg ovn.<ol>
<li>Sted 0,6 g af molybdæn trioxid (MoO3) pulver i en kvarts båd ligger på varmen zone midt i ovnen. Læg den safir substrat nedstrøms siden kvarts båden indehold...

<ol>
	<li>Kim, Y. B. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Challenges+for+Nanoscale+MOSFETs+and+Emerging+Nanoelectronics.">Challenges for Nanoscale MOSFETs and Emerging Nanoelectronics.</a> Transactions on Electrical and Electronic Materials. 11 (3), 93-105 (2010).</li><li>Waldrop, M. M. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=The+chips+are+down+for+Moore's+law.">The chips are down for Moore's law.</a> Nature. 530 (7589), 144-147 (2016).</li><li>Lan, Y. W., Chang, W. H., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Effects+of+oxygen+bonding+on+defective+semiconducting+and+metallic+single-walled+carbon+nanotube+bundles.">Effects of oxygen bonding on defective semiconducting and metallic single-walled carbon nanotube bundles.</a> Carbon. 50 (12), 4619-4627 (2012).</li><li>Lan, Y. W., Aravind, K., Wu, C. S., Kuan, C. H., Chang-Liao, K. S., Chen, C. D. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Interplay+of+spin-orbit+coupling+and+Zeeman+effect+probed+by+Kondo+resonance+in+a+carbon+nanotube+quantum+dot.">Interplay of spin-orbit coupling and Zeeman effect probed by Kondo resonance in a carbon nanotube quantum dot.</a> Carbon. 50 (10), 3748-3752 (2012).</li><li>Lan, Y. W., Nguyen, L. N., Lai, S. J., Lin, M. C., Kuan, C. H., Chen, C. D. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Identification+of+embedded+charge+defects+in+suspended+silicon+nanowires+using+a+carbon-nanotube+cantilever+gate.">Identification of embedded charge defects in suspended silicon nanowires using a carbon-nanotube cantilever gate.</a> Applied Physics Letters. 99 (5), (2011).</li><li>De Volder, M. F. L., Tawfick, S. H., Baughman, R. H., Hart, A. J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Carbon+nanotubes:+present+and+future+commercial+applications.">Carbon nanotubes: present and future commercial applications.</a> Science (New York, N.Y.). 339 (6119), 535-539 (2013).</li><li>Eatemadi, A., Daraee, H., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Carbon+nanotubes:+Properties,+synthesis,+purification,+and+medical+applications.">Carbon nanotubes: Properties, synthesis, purification, and medical applications.</a> Nanoscale Research Letters. 9 (1), 1-13 (2014).</li><li>Lan, Y. W., Chang, W. H., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Polymer-free+patterning+of+graphene+at+sub-10-nm+scale+by+low-energy+repetitive+electron+beam.">Polymer-free patterning of graphene at sub-10-nm scale by low-energy repetitive electron beam.</a> Small. 10 (22), 4778-4784 (2014).</li><li>Romero, M. F., Bosca, A., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Impact+of+2D-Graphene+on+SiN+Passivated+AlGaN/GaN+MIS-HEMTs+Under+Mist+Exposure.">Impact of 2D-Graphene on SiN Passivated AlGaN/GaN MIS-HEMTs Under Mist Exposure.</a> IEEE Electron Device Letters. 38 (10), 1441-1444 (2017).</li><li>Blaschke, B. M., Tort-Colet, N., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Mapping+brain+activity+with+flexible+graphene+micro-transistors.">Mapping brain activity with flexible graphene micro-transistors.</a> 2D Materials. 4 (2), 25040 (2017).</li><li>Zhu, Z., Murtaza, I., Meng, H., Huang, W. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Thin+film+transistors+based+on+two+dimensional+graphene+and+graphene/semiconductor+heterojunctions.">Thin film transistors based on two dimensional graphene and graphene/semiconductor heterojunctions.</a> RSC Advances. 7 (28), 17387-17397 (2017).</li><li>Kim, S. J., Choi, K., Lee, B., Kim, Y., Hong, B. H. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Materials+for+Flexible,+Stretchable+Electronics:+Graphene+and+2D+Materials.">Materials for Flexible, Stretchable Electronics: Graphene and 2D Materials.</a> Annual Review of Materials Research. 45 (1), 63-84 (2015).</li><li>Manzeli, S., Ovchinnikov, D., Pasquier, D., Yazyev, O. V., Kis, A. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=2D+transition+metal+dichalcogenides.">2D transition metal dichalcogenides.</a> Nature Reviews Materials. 2, (2017).</li><li>Kolobov, A. V., Tominaga, J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Emerging Applications of 2D TMDCs. 239, 473-512 (2016).</li><li>Nguyen, L. N., Lan, Y. W., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Resonant+tunneling+through+discrete+quantum+states+in+stacked+atomic-layered+MoS2.">Resonant tunneling through discrete quantum states in stacked atomic-layered MoS2.</a> Nano Letters. 14 (5), 2381-2386 (2014).</li><li>Torres, C. M., Lan, Y. W., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=High-Current+Gain+Two-Dimensional+MoS2-Base+Hot-Electron+Transistors.">High-Current Gain Two-Dimensional MoS2-Base Hot-Electron Transistors.</a> Nano Letters. 15 (12), 7905-7912 (2015).</li><li>Jariwala, D., Sangwan, V. K., Lauhon, L. J., Marks, T. J., Hersam, M. C. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Emerging+Device+Applications+for+Semiconducting+Two-Dimensional+Transition+Metal+Dichalcogenides.">Emerging Device Applications for Semiconducting Two-Dimensional Transition Metal Dichalcogenides.</a> ACS Nano. 8 (2), 1102-1120 (2014).</li><li>Choi, W., Choudhary, N., Han, G. H., Park, J., Akinwande, D., Lee, Y. H. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Recent+development+of+two-dimensional+transition+metal+dichalcogenides+and+their+applications.">Recent development of two-dimensional transition metal dichalcogenides and their applications.</a> Materials Today. 20 (3), 116-130 (2017).</li><li>Xiao, H. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Introduction to Semiconductor Manufacturing Technology, Second Edition. , (2012).</li><li>Lin, C. Y., Zhu, X., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Atomic-Monolayer+Two-Dimensional+Lateral+Quasi-Heterojunction+Bipolar+Transistors+with+Resonant+Tunneling+Phenomenon.">Atomic-Monolayer Two-Dimensional Lateral Quasi-Heterojunction Bipolar Transistors with Resonant Tunneling Phenomenon.</a> ACS Nano. 11 (11), 11015-11023 (2017).</li><li>Qi, J., Lan, Y. W., et al. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Piezoelectric+effect+in+chemical+vapour+deposition-grown+atomic-monolayer+triangular+molybdenum+disulfide+piezotronics.">Piezoelectric effect in chemical vapour deposition-grown atomic-monolayer triangular molybdenum disulfide piezotronics.</a> Nature Communications. 6, (2015).</li></ol>

I denne artikel, er de detaljerede procedurer for opdigte nye elektronik baseret på 2D materialer i nanometer skala påvist. Da prøven forberedelse procedurer af hver ansøgning er uenige med hinanden, blev de overlappende processer behandlet som protokol. Elektron beam mønstre kombineret med materielle placering beslutsomhed og metal elektrode definition således fungerer som protokol her. Blandt de to typer af enheder nævnt, hele processen med 2D back-gated transistorer starter ved våd overføre enkelt krystal MoS...

Siden tidligere årtier, har menneskeheden oplevet hurtige nedskalere i størrelsen af transistorer, og dermed en eksponentiel stigning i antallet af transistorer i integrerede kredsløb (ICs). Dette fastholder de fortsatte fremskridt af silicium-baserede komplementær metal-oxid halvleder (CMOS) teknologi1. Desuden, denne tendensen i størrelse og ydeevne af opdigtet enheder er stadig på-spor med Moores lov, hvori det hedder, at antallet af transistorer på elektroniske chips, samt deres ydeevne, fordobler omtrent hver to år2. CMOS transistorer er til stede i de fleste, hvis ikke alle, af de elektroniske enheder i markedet og dermed gøre det en integreret del af menneskers liv. På grund af dette er der løbende krav om forbedringer i chip størrelse og ydelse, som har presser producenterne til at holder følgende Moore's law spor.
Desværre synes Moores lov at nærmer sig sin afslutning på grund af mængden af varme, der genereres som mere silicium kredsløb er presset ind i et lille område2. Dette kræver nye typer af materialer, der kan give det samme, hvis ikke bedre, ydeevne som silicium og på samme tid, kan gennemføres i en relativt mindre skala. For nylig, nye lovende materialer har været genstand for mange materiallære forsker. Sådanne materialer som endimensional (1D) kulstof nanorør3,4,5,6,7, 2D graphene8,9,10, 11 , 12, og overgangen metal dichalcogenides (TMDs)13,14,15,16,17,18, er gode kandidater, der kan bruges som erstatte silicium-baserede CMOS og fortsætte den Moores lov spor.
Fabrikation af mindre enheder kræver omhyggelig bestemmelse af materialets placering med held videre til de andre fabrication teknikker som litografi og metal elektrode definition. Så var metoden præsenteres i dette dokument designet til at løse dette behov. Sammenlignet med traditionelle semiconductor fabrication teknikker19, er tilgang præsenteres i dette papir skrædder-monteret til udviklingen af små enheder, som kræver mere opmærksomhed med hensyn til at finde placeringen af materialet. Formålet med denne metode er at pålideligt fremstille 2D nanomateriale enheder, såsom 2D back-gated transistorer og Q-HBTs, ved hjælp af standard fabrication processer. Dette kan tjene som en platform for fremtidige nanodevice udvikling som det baner vej for produktionen af fremtidige avancerede nanoskala enheder.
I afsnittet procedure er fabrication processer for 2D materialer-baserede enheder nemlig, Q-HBT og 2D back-gated transistor drøftet i detaljer. Elektron beam mønstre kombineret med materielle placering beslutsomhed og metal elektrode definition omfatter protokollen, da de er nødvendige i begge nævnte processer. Del 1 beskriver den trinvise fabrikationsproces Q-HBTs20; og del 2 viser en universel tilgang for at opnå kemisk damp deposition (CVD) molybdæn disulfid (MoS2) back-gated transistorer fra overførsel til lift-off21, som har været helt vist i artiklen. Den detaljerede procesforløb illustreres i (figur 1).

<table border="0" cellpadding="0" cellspacing="0" style="width:973px;" width="973">
	<tbody>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">E-gun Evaporator</td>
			<td style="width:175px;">AST</td>
			<td style="width:255px;">PEVA 600I</td>
			<td style="width:296px;"></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Au slug, 99.99%</td>
			<td>Well-Being Enterprise Co</td>
			<td>&#160;N/A</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Ti slug, 99.99%</td>
			<td>Well-Being Enterprise Co</td>
			<td>&#160;N/A</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">E-beam Lithography System</td>
			<td style="width:175px;">Elionix</td>
			<td style="width:255px;">ELS7500-EX</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Cold Wall CVD System</td>
			<td style="width:175px;">Sulfur Science</td>
			<td style="width:255px;">SCW600S</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">C-plane Sapphire substrate</td>
			<td style="width:175px;">Summit-Tech</td>
			<td style="width:255px;">X171999</td>
			<td>(0001) &#177; 0.2 &#176; one side polished</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">100 nm SiO2/Si</td>
			<td style="width:175px;"></td>
			<td style="width:255px;"></td>
			<td>Fabricated in NDL</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Ammonia Solution</td>
			<td style="width:175px;">BASF</td>
			<td style="width:255px;">Ammonia Solution 28% Selectipur</td>
			<td style="width:296px;"></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Molybdenum (Mo), 99.95%</td>
			<td style="width:175px;">Summit-Tech&#160;</td>
			<td style="width:255px;">N/A</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Tungsten (W), 99.95%</td>
			<td style="width:175px;">Summit-Tech&#160;</td>
			<td style="width:255px;">N/A</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Sulfur (S), 99.5%</td>
			<td style="width:175px;">Sigma-Aldrich&#160;</td>
			<td style="width:255px;">13803</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Polymethyl Methacrylate (PMMA)</td>
			<td style="width:175px;">Microchem&#160;</td>
			<td style="width:255px;">8110788</td>
			<td>Use for transfer process</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Spin Coater</td>
			<td>Laurell&#160;</td>
			<td>WS 400B 6NPP LITE</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Acetone</td>
			<td style="width:175px;">BASF</td>
			<td style="width:255px;">Acetone EL Selectipur</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Isopropanol (IPA)</td>
			<td style="width:175px;">BASF</td>
			<td style="width:255px;">2-Propanol UPS</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Photo Resist for EBL</td>
			<td style="width:175px;">TOK</td>
			<td style="width:255px;">TDUR-P-015</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:248px;">Plasma Cleaner</td>
			<td style="width:175px;">Harrick Plasma</td>
			<td style="width:255px;">PDC-32G</td>
			<td>Oxygen plasma</td>
		</tr>
	</tbody>
</table>

a standard and reliable method to fabricate two-dimensional nanoelectronics

Todimensionale (2D) materialer har tiltrukket stor opmærksomhed på grund af deres unikke egenskaber og potentielle anvendelsesmuligheder. Da wafer skala syntesen af 2D materialer er stadig i spirende stadier, stole forskerne ikke fuldt på traditionelle semiconductor teknikker til forskning. Delikat processer fra at finde materialer til elektrode definition skal kontrolleres godt. I denne artikel kræves en universal fabrikation protokol i fremstilling nanoskala elektronik, såsom 2D kvasi-heterojunction bipolære transistorer (Q-HBT) og 2D back-gated transistorer er påvist. Denne protokol omfatter bestemmelse af materielle position, elektron beam litografi (kvægleukose), metal elektrode definition, mfl. En trin for trin fortælling af fabrikation procedurer for disse enheder er også præsenteret. Resultaterne viser endvidere, at hver af de fremstillede enheder har opnået høj ydeevne med høj repeterbarhed. Dette arbejde afslører en omfattende beskrivelse af procesforløbet for at forberede 2D nano-elektronik, giver mulighed for forskningsgrupper at få adgang til disse oplysninger, og bane vejen mod fremtidige elektronik.

Enheden fabrication processer er blevet anvendt til flere af de tilsvarende forfatteren undersøgelser vedrørende udviklingen af 2D materiale enheder. I denne del præsenteres resultaterne af nogle af disse undersøgelser for at påvise effektivisering af protokollen diskuteret ovenfor. En éncellelag af laterale WSe2-MoS2 Q-HBT20 er valgt som det første eksempel. Brug standard enhed fabrication processer detaljeret i protokollen, éncellela...

Watch this Scientific Journal Video about A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics at JoVE.com

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Artiklen har til formål at indføre en standard og pålidelige fabrikation procedure for udviklingen af fremtidige lav dimensionelle nanoelektronik.

En Standard og pålidelig metode til at fremstille todimensionale nanoelektronik

Two-dimensional (2D) materials have attracted huge attention due to their unique properties and potential applications. Since wafer scale synthesis of 2D ...

Research

JoVE Journal

Engineering

A Method to Fabricate Disconnected Silver Nanostructures in 3D

En metode til at fabrikere Afbrudt Sølv Nanostrukturer i 3D

The standard nanofabrication toolkit includes  techniques primarily aimed at creating 2D patterns in dielectric media. Creating  metal patterns on a ...

Nanomoulding of Functional Materials, a Versatile Complementary Pattern Replication Method to Nanoimprinting

Nanomoulding af funktionelle materialer, en alsidig komplementært mønster Replication Metode til Nanoimprinting

We describe a nanomoulding technique which  allows low-cost nanoscale patterning of functional materials, materials stacks  and full devices. Nanomoulding ...

A Method for Studying the Temperature Dependence of Dynamic Fracture and Fragmentation

En metode til at studere temperaturafhængighed Dynamic Fracture og fragmentering

The dynamic fracture of a body is a late-stage phenomenon typically studied under simplified conditions, in which a sample is deformed under uniform ...

A Cost-effective and Reliable Method to Predict Mechanical Stress in Single-use and Standard Pumps

En omkostningseffektiv og pålidelig metode til at forudsige Mekanisk stress i Single-brug og Standard Pumper

Pumps are mainly used when transferring sterile culture broths in biopharmaceutical and biotechnological production processes. However, during the pumping ...

Standardized Method for Measuring Collection Efficiency from Wipe-sampling of Trace Explosives

Standardiseret metode til måling Collection Effektivitet fra wipe-sampling af Trace Sprængstoffer

One of the limiting steps to detecting traces of explosives at screening venues is effective collection of the sample. Wipe-sampling is the most common ...

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

En ny metode til<em&gt; I situ</em&gt; Elektromekanisk karakterisering af nanoskalaeksempler

Electrically assisted deformation (EAD) is increasingly being used to improve the formability of metals during processes such as sheet metal rolling and ...

Experimental Implementation of a New Composite Fabrication Method: Exposing Bare Fibers on the Composite Surface by the Soft Layer Method

Eksperimentelle gennemførelsen af en ny Composite fabrikationsanlæg metode: udsætter nøgne fibre på sammensatte overfladen af metoden bløde lag

The bipolar plate is a key component in proton exchange membrane fuel cells (PEMFCs) and vanadium redox flow batteries (VRFBs). It is a multi-functional ...

Method for Recording Broadband High Resolution Emission Spectra of Laboratory Lightning Arcs

Metode til optagelse af bredbånds spektre med høj opløsnings emission af laboratorie Lynbuer

Lightning is one of the most common and destructive forces in nature and has long been studied using spectroscopic techniques, first with traditional ...

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy

En fabrikation og målemetode for en fleksibel Ferroelectric Element baseret på Van Der Waals Heteroepitaxy

Flexible non-volatile memories have received much attention as they are applicable for portable smart electronic device in the future, relying on ...

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform

Skalerbare Quantum integrerede kredsløb på superledende todimensionale elektron Gasplatform

To form a coherent quantum transport in hybrid superconductor-semiconductor (S-Sm) junctions, the formation of a homogeneous and barrier-free interface ...