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胶孔溶液的表达及其化学成分和电阻率的 X 射线荧光分析

DOI :

10.3791/58432-v

6:27 min

September 23rd, 2018

September 23rd, 2018

8,643 Views

1Civil and Construction Engineering, Oregon State University, 2SES Group and Associates LLC, Turner-Fairbank Highway Research Center, 3Civil, Architectural and Environmental Engineering, University of Miami

本协议描述了用 X 射线荧光法从胶凝体系中表达新鲜孔隙溶液的方法和离子成分的测定。离子组成可用于计算孔隙溶液的电阻率, 并可与混凝土电阻率一起使用, 确定地层因素。

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