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用于抗倍体植入前基因测试的半导体测序

DOI :

10.3791/59273-v

August 25th, 2019

August 25th, 2019

9,143 Views

1Department of Genetics and Metabolism, Maternal and Child Health Hospital of Guangxi Zhuang Autonomous Region, 2Birth Defects Prevention and Control Institute of Guangxi Zhuang Autonomous Region, 3Shenzhen Research Institute, The Chinese University of Hong Kong, 4Department of Obstetrics and Gynaecology, The Chinese University of Hong Kong, 5State Key Laboratory of Microbial Metabolism, Joint International Research Laboratory of Metabolic and Developmental Sciences, School of Life Sciences and Biotechnology, Shanghai Jiao Tong University, 6Basecare Medical Device Co., Ltd

这里介绍了一种半导体测序方法,用于非倍体(PGT-A)的植入前基因检测,具有周转时间短、成本低、通量高等优点。

Tags

150 PGT A WGA

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