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이류성 에 대한 착상 전 유전자 검사를위한 반도체 시퀀싱

DOI :

10.3791/59273-v

August 25th, 2019

August 25th, 2019

9,143 Views

1Department of Genetics and Metabolism, Maternal and Child Health Hospital of Guangxi Zhuang Autonomous Region, 2Birth Defects Prevention and Control Institute of Guangxi Zhuang Autonomous Region, 3Shenzhen Research Institute, The Chinese University of Hong Kong, 4Department of Obstetrics and Gynaecology, The Chinese University of Hong Kong, 5State Key Laboratory of Microbial Metabolism, Joint International Research Laboratory of Metabolic and Developmental Sciences, School of Life Sciences and Biotechnology, Shanghai Jiao Tong University, 6Basecare Medical Device Co., Ltd

여기서는 짧은 처리 시간, 낮은 비용 및 높은 처리량의 장점을 가진 이수성 (PGT-A)에 대한 착상 전 유전자 검사를위한 반도체 염기서열 분석 방법을 소개합니다.

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