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DOI :
10.3791/59480-v
•
9:09 min
August 10th, 2019
Chapters
0:04
Title
0:51
Sample Fixation and Processing for Electron Microscopy
3:51
Prepare Embedded Samples for Imaging
5:03
Imaging in the SBF-SEM (Serial Block Face Scanning Electron Microscopy) and Data Processing
6:22
Imaging in the FIB-SEM (Focused Ion Beam SEM)
7:49
Results: SBF-SEM and FIB-SEM Data
8:46
Conclusion
在这里,我们提出了一个协议,有效地结合串行块面和聚焦电束扫描电子显微镜的目标领域。这允许在三维中进行高效的搜索,并在大型视野中定位罕见事件。
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