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DOI :
10.3791/59480-v
•
9:09 min
August 10th, 2019
Chapters
0:04
Title
0:51
Sample Fixation and Processing for Electron Microscopy
3:51
Prepare Embedded Samples for Imaging
5:03
Imaging in the SBF-SEM (Serial Block Face Scanning Electron Microscopy) and Data Processing
6:22
Imaging in the FIB-SEM (Focused Ion Beam SEM)
7:49
Results: SBF-SEM and FIB-SEM Data
8:46
Conclusion
ここでは、シリアルブロック面と集積イオンビーム走査電子顕微鏡を効率的に組み合わせて対象領域を標的とするプロトコルを紹介する。これにより、3 次元で効率的な検索を行い、大きな視野でまれなイベントを検索できます。
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