Research
Education
Sign In
EN
EN - English
CN - 中文
DE - Deutsch
ES - Español
KR - 한국어
IT - Italiano
FR - Français
PT - Português
Please note that all translations are automatically generated. Click here for the English version.
DOI :
10.3791/60004-v
January 19th, 2020
Chapters
0:04
Title
0:51
Aligning the Focus Ion Beam (FIB) to the Silicon Probes
9:46
Writing an Automated Process for Etching
11:28
Results: FIB Etched Nano-architecture on the Surfaces of Intracortical Probes and Microelectrodes Affects Neuron Density and Electrophysiology
13:08
Conclusion
我々は、皮質内マイクロ電極デバイスへのナノアーキテクチャのエッチングは、炎症反応を減少させ、電気生理学的記録を改善する可能性を有することを示した。本明細書に記載される方法は、非機能的かつ機能的な単一シャンクシリコン皮質内マイクロ電極の表面にナノアーキテクチャをエッチングするアプローチを概説する。
Tags
-- Views
Related Videos
Privacy
Terms of Use
Policies
Contact Us
Recommend to library
JoVE NEWSLETTERS
JoVE Journal
Methods Collections
JoVE Encyclopedia of Experiments
Archive
JoVE Core
JoVE Business
JoVE Science Education
JoVE Lab Manual
Faculty Resource Center
Authors
Overview
Publishing Process
Editorial Board
Scope and Policies
Peer Review
FAQ
Submit
Librarians
Testimonials
Subscriptions
Access
Resources
Library Advisory Board
ABOUT JoVE
Leadership
Copyright © 2024 MyJoVE Corporation. All rights reserved