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DOI :
10.3791/61334-v
September 25th, 2020
Chapters
0:04
Introduction
0:56
Scanning Electron Microscope (SEM) Characterization
3:18
Optical Spin-Multiplexed Metahologram Characterization
5:44
Optical Direction-Multiplexed Metahologram Characterization
6:46
Results: Representative Spin- and Directed-Multiplexed Metahologram Imaging
8:04
Conclusion
スピンおよび方向多重化可視メタホログラムの作製プロトコルを提示し、光学実験を行ってその機能を検証する。これらのメタホログラムは、エンコードされた情報を簡単に視覚化できるため、射出容積表示や情報暗号化に使用できます。
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