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用于ToF-SIMS和XPS分析的纳米颗粒的制备

DOI :

10.3791/61758-v

6:24 min

September 13th, 2020

September 13th, 2020

6,646 Views

1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

介绍了制备用于表面分析的纳米颗粒的多种不同程序(滴铸,旋涂,粉末沉积和冷冻固定)。我们讨论了每种方法的挑战,机遇和可能的应用,特别是关于不同制备方法引起的表面性能变化。

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163 XPS ToF SIMS

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