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Präparation von Nanopartikeln für die ToF-SIMS- und XPS-Analyse

6.8K Views

06:24 min

September 13th, 2020

DOI :

10.3791/61758-v

September 13th, 2020

6,798 Views

1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

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